Experimental setup and measurement principle:

The CRISP team has developed a time-resolved X-ray diffraction platform under multiple constraints (temperature, electric field, pressure, continuous laser, pulsed laser) with the objective of determining structure-property relationships by simultaneously monitoring:

– the structural response under constraint by X-ray diffraction on single crystals

– the response of associated physical properties (optical, electronic)

The 4-circle goniometer allows, through perfect orientation of single-crystal samples, the study of anisotropy of tensor physical properties.

The measurement principle is based on a pump-multiprobe scheme using the multiplexing capabilities of a hybrid pixel detector with direct photon counting.

Crystallography under pressure :

Several diamond anvil pressure cells are available to apply in-situ hydrostatic pressure and monitor piezochromic processes and phase transitions under pressure.

Crystallography under Electric Field:

Several sample holders have been developed in the laboratory’s workshop to perform measurements under electric fields in resistive or capacitive configurations. Applications range from piezoelectric and multiferroic materials to ferroelectric systems.

Physical property measurement:

The device allows for absorption and transient absorption spectroscopy measurements (time resolution of around 5 ns)

The device allows photoluminescence and transient photoluminescence measurements to be carried out (time resolution of the order of 5 ns).

These measurements can be carried out under pressure and under an electric field.